Efficiently evaluate coma behavior across complete optical systems

Understanding coma aberrations across all system configurations, wavelengths, and field points is critical for ensuring optimal imaging performance. Advanced Coma Analysis streamlines this evaluation by systematically calculating coma values - delivering detailed insights for both design verification and system optimization.

The tool extracts both Zernike astigmatism and Seidel astigmatism values, providing comprehensive insight into third-order and primary aberrations. It computes astigmatism with user-defined increments over field points and pupil positions and outputs the results for further evaluation.

Key Features:

- Comprehensive Analysis: Calculates coma for each configuration, wavelength, and field point of the optical system.

- High Precision Output: Coma values are expressed in milliwaves (mλ) for accurate and meaningful interpretation.

- Graphical Visualization: Intuitive plots reveal coma trends and system behavior.

- Data Export: All calculated values are saved into structured text files for further processing and reporting.

With Advanced Coma Analysis, optical engineers and designers gain a deeper understanding of coma aberrations throughout their designs, enabling more informed decisions and improved optical system performance.

Looking for additional functionality? We offer free customization. Whether you need specific plots, analysis features, or other enhancements, we’ll tailor this tool to your requirements—at no extra development cost.